DISEÑO, SIMULACIÓN E IMPLEMENTACIÓN DE UN CIRCUITO DIGITAL DE MÚLTIPLE RAZÓN DE VENTANA PARA EL ESTUDIO DE TRAMPAS (DESING, SIMULATION AND IMPLEMENTATION OF A DIGITAL CIRCUIT OF MULTI-RATE-WINDOW FOR THE STUDY OF TRAPS)

Francisco Javier Arizaga Ayala, Armando Gregorio Rojas Hernández

Resumen


Resumen
El presente documento describe el uso de un microcontrolador TMS320F28027 como un sistema completamente digital usado para obtener información de transitorios de corriente gracias a la aplicación de un sistema de múltiple razón de ventana. El sistema digital de múltiple razón de ventana mejora la resolución de detección de trampas debido a la cantidad de espectros que se pueden tener en un análisis. El propósito del sistema es extraer la información de una señal transitoria de una película de CdS a través de un transitorio de corriente para posteriormente procesarla y caracterizarla. Un sistema analógico está limitado por la cantidad de circuitos usados en la misma duración del pulso. Por lo tanto, el sistema digital es mejorado en comparación con el sistema analógico obteniendo información de diferentes partes del transitorio y no específicamente de un lugar como lo hace el sistema analógico.
Palabras Clave: Espectroscopía, niveles profundos, razón de ventana múltiple, sistema digital.

Abstract
The present document describes the use of a TMS320F28027 microcontroller as a completely digital system used to get information of current transients thanks to the application of a multi-rate window. The digital system of multi-rate window improves the resolution at traps detection due to the spectra amount that can be obtained for analysis. The system's purpose is to extract the information of a transient signal from a CdS thin film through its current transient to later process and characterize it. Therewith, information was obtained of the difference from the current transient at different parts during the pulse duration. An analog system is limited by the circuits amount used in the same pulse duration. Therefore, the digital system has an improvement compared to an analog system since we can analyze the difference of the transient at different parts and not only in a specific place just like an analog system does.
Keywords: Deep levels, digital system, multi-rate-window, spectroscopy.

Texto completo:

190-205 PDF

Referencias


Acosta Ortiz, S.E., Niveles profundos en semiconductores, Revista Mexicana de Física, 1988.

AvilaGarcia, A., Computerized digitizing technique for dlts measurements, IEEE Transactions on Instrumentation and Measurement, 1994.

Avila García Alejandro, Computerized dlts system to characterize deep levels in semiconductors, Revista Mexicana de Física, 2002.

Holzlein K., Fast computer-controlled deep level transient spectroscopy system for versatile applications in semiconductors, Review of Scientific Instruments, 1986.

Komin, V., Identification of defect levels in cdte/cds solar cells using deep level transient spectroscopy, Photovoltaic Specialists Conference, 2002.

Losson E, New method of deep level transient spectroscopy analysis: a five emission rate method, Materials Science and Engineering, 1993.

Martinez J, A new sequential four-rate-window dlts system, IEEE Transactions on Instrumentation and Measurement, 1987.

Micocci, G. P., Photoinduced current transient spectroscopy in inse single crystals, Solar Energy Materials, 1990.

Rancour, D. P., A sensitive technique for detecting low concentrations of deep level traps: Current source deep level transient spectroscopy, Journal of Applied Physics, 1995.

Reddy, C. V., A simple and inexpensive circuit for emission and capture deep level transient spectroscopy, Review of Scientific Instruments, 1996.

Reddy P, Development of computer controlled deep level transient spectroscopy system, IETE Technical Review, 1998.

Schmidt F., Low rate deep level transient spectroscopy - a powerful tool for defect characterization in wide bandgap semiconductors, Solid-State Electronics, 2014.

Weiss S., Deep level transient fourier spectroscopy (dltfs) a technique for the analysis of deep level properties, Solid-State Electronics, 1988.

Zhou J., Deep level transient spectroscopy system designed by labview, in Advanced Information and Computer Technology in Engineering and Manufacturing, Environmental Engineering, Advanced Materials Research, 2013.






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